Machinery & Equipment
AFM Probe
Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. An AFM probe has a sharp tip on the free-swinging end of a cantilever that is protruding from a holder. The dimensions of the cantilever are…
- Types
- Silicon AFM Probes · Silicon Nitride AFM Probes · Diamond AFM Probes
- Applications
- Life Sciences and Biology · Materials · Semiconductors and Electronics
5 editions2 January 2026
$3,950Single user · USD · Market StructureExplore product: AFM ProbeCompare research options for AFM Probe