Electronics & Semiconductor
Logic Test Probe Card
A Logic Test Probe Card is an interface between an electronic test system and a semiconductor wafer. Typically the Logic Test Probe Card is mechanically docked to a prober and electrically connected to a tester. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually before they are diced and packaged.
- Types
- Vertical Needle/tip · Thin Film MLO · Membrane Logic Test Probe Card
- Applications
- SME · Large Enterprise
5 editions30 December 2025
$3,950Single user · USD · Market StructureExplore product: Logic Test Probe CardCompare research options for Logic Test Probe Card